Secondary Ion Mass Spectrometry and Its Application to Materials Science (Second Edition)

In this edition, a more detailed overview of the principles of SIMS is given, and of how the development of dual-beam instruments has blurred the traditional fields of dynamic and static SIMS to enable greater analytical possibilities. This is an ideal text for final year undergraduates, first year PhD students, and anyone who may be starting out using secondary ion mass spectrometry as part of their research.